• Àüü
  • ÀüÀÚ/Àü±â
  • Åë½Å
  • ÄÄÇ»ÅÍ
´Ý±â

»çÀÌÆ®¸Ê

Loading..

Please wait....

±¹³» ³í¹®Áö

Ȩ Ȩ > ¿¬±¸¹®Çå > ±¹³» ³í¹®Áö > Çѱ¹Á¤º¸°úÇÐȸ ³í¹®Áö > Á¤º¸°úÇÐȸ ³í¹®Áö A : ½Ã½ºÅÛ ¹× ÀÌ·Ð

Á¤º¸°úÇÐȸ ³í¹®Áö A : ½Ã½ºÅÛ ¹× ÀÌ·Ð

Current Result Document :

ÇѱÛÁ¦¸ñ(Korean Title) SSD¸¦ À§ÇÑ SMART ±â¹Ý ½Å·Ú¼º ºÐ¼® ¹æ¹ý·Ð: ÃøÁ¤°ú ÀǹÌ
¿µ¹®Á¦¸ñ(English Title) SMART based Dependability Analysis Methodology for SSD: Measurements and Implications
ÀúÀÚ(Author) ±è¼¼¿í   À̻󿱠  ÀüÁ¤È£   ÃÖÁ¾¹«   ¾çÁß¼·   ¸ð¿¬Áø   ½Å¿µ±Õ   Sewoog Kim   Sangyup Lee   Jeongho Jeon   Jongmoo Choi   Joongseob Yang   Yeonjin Mo   Youngkyun Shin  
¿ø¹®¼ö·Ïó(Citation) VOL 38 NO. 05 PP. 0207 ~ 0215 (2011. 10)
Çѱ۳»¿ë
(Korean Abstract)
ÃÖ±Ù, ¼¿´ç ¿©·¯ ºñÆ®¸¦ ÀúÀåÇÏ·Á´Â MLC ±â¼ú°ú ´ÜÀ§ ¸éÀû´ç ÀúÀå ¹Ðµµ¸¦ Çâ»ó½ÃÅ°´Â ±â¼ú·Â Àû¿ëÀ¸·Î Ç÷¡½Ã ¸Þ¸ð¸®ÀÇ ¿ë·®Àº Å©°Ô Áõ°¡ÇÏ°í ÀÖ´Ù. ÇÏÁö¸¸ ÀÌ·¯ÇÑ ±â¼úµéÀº ¼¿°£ °£¼·À» Áõ°¡½ÃÄÑ Àбâ/¾²±â ±³¶õÀ» ¾ß±âÇϸç ÇÁ·Î±×·¥/»èÁ¦ ¿¬»ê Ƚ¼ö Á¦ÇÑ°ú µ¥ÀÌÅÍ À¯Áö ¹®Á¦¸¦ ¾ÇÈ­½ÃÄÑ, Ç÷¡½Ã ¸Þ¸ð¸® ±â¹Ý ÀúÀå ÀåÄ¡ÀÇ ½Å·Ú¼º¿¡ ´ëÇÑ °ÆÁ¤À» Áõ°¡½ÃÅ°°í ÀÖ´Ù. ÀÌ·¯ÇÑ °ÆÁ¤À» ¿ÏÈ­ÇÒ ¼ö ÀÖ´Â Ãâ¹ßÁ¡À¸·Î º» ³í¹®¿¡¼­´Â SSDÀÇ ½Å·Ú¼º À̽´¸¦ ü°èÀûÀÌ°í Á¤·®ÀûÀ¸·Î Á¶»çÇÒ ¼ö ÀÖ´Â ¹æ¹ý·Ð°ú µµ±¸¸¦ Á¦¾ÈÇÑ´Ù. ÀÌ°ÍÀº SMART(Self Monitoring Analysis and Reporting Technology) ±â¼úÀ» ÀÌ¿ëÇÏ¿© SSD¿¡¼­ ºí·ÏµéÀÇ Æò±Õ »èÁ¦ Ƚ¼ö, I/O ÀÀ´ä ½Ã°£, ¹èµå ºí·Ï °³¼ö µîÀÇ ´Ù¾çÇÑ ¼Ó¼º Á¤º¸¸¦ ¿©·¯ ¿öÅ©·Îµå »óȲ¿¡¼­ ÃøÁ¤ÇÒ ¼ö ÀÖ´Ù. ¶ÇÇÑ ÃøÁ¤µÈ °á°ú¸¦ ºÐ¼®ÇÏ¿© SSDÀÇ Æò±Õ ¼ö¸í, ¼øÂ÷/ÀÓÀÇ ¿öÅ©·Îµå°¡ ³»±¸¼º¿¡ ³¢Ä¡´Â ¿µÇâ, ¹èµå ºí·ÏÀÇ ¹ß»ýÀÌ ¼º´É¿¡ ³¢Ä¡´Â ¿µÇâ µîÀÇ Á¤º¸¸¦ Á¦°øÇÒ ¼ö ÀÖ´Ù. ½ÇÁ¦ 6°³ÀÇ SSD¸¦ ÀÌ¿ëÇÑ ½ÇÇèÀ» ÅëÇØ, Á¦¾ÈµÈ ¹æ¹ý·Ð ¹× µµ±¸°¡ SSDÀÇ ³»ºÎ ±¸Á¶¸¦ ÀûÀýÇÏ°Ô ºÐ¼®ÇÏ°í ÀÖÀ¸¸ç, SSDÀÇ ½Å·Ú¼ºÀ» Æò°¡, Çâ»ó ½Ãų ¼ö ÀÖ´Â À¯¿ëÇÑ Á¤º¸¸¦ Á¦°øÇÒ ¼ö ÀÖÀ½À» º¸¿´´Ù.
¿µ¹®³»¿ë
(English Abstract)
These days, the capacity of flash memory is increasing rapidly by applying MLC (Multi Level Cells) techniques and raising the storage density per unit area. However, such technologies cause the interference among cells such as read and write disturbances and deteriorate the program/erase cycles and data retention problems, leading to the dependability as the primary concern of flash memory based storage devices. As a starting point to mitigate the concern, in this paper, we propose a new methodology and tool that can explore the dependability issues of SSD (Solid State Drives) systematically and quantitatively. Using the SMART (Self"]Monitoring Analysis and Reporting Technology), it can measure diverse attributes such as the average erase count of blocks, I/O response time, and the number of bad blocks under the various workloads. Also, it analyzes the measurements and provides their implications including the expected lifetime of SSD, the effects of sequential/random workloads on endurance, and the effects of bad blocks on performance. Real experiments with six commercial SSDs have shown that the proposed methodology can interpret the internal behaviors appropriately and suggest useful information to evaluate and enhance the dependability of SSDs.
Å°¿öµå(Keyword) SSD   Solid-State Drives   SMART   Self-Monitoring Analysis and Reporting Technology   SMART Attributes   SMART ¼Ó¼º  
ÆÄÀÏ÷ºÎ PDF ´Ù¿î·Îµå